Equipment list: Electron Microscopy and Microanalysis Facility
- JEOL-JEM 2100F Analytical Transmission Electron Microscope (TEM)
- Hitachi S-4700 II Scanning Electron Microscope (SEM)
- Fischione Instruments model 150 dimpling grinder
- Fischione Instruments model 170 ultrasonic disk cutter
- Buehler Isomet low speed saw
- Fischione Instruments model 1010 low angle ion mill
- Quorum Technologies K575X turbo sputter coater
- Fischione Instruments model 110 automatic twin-jet electropolisher
- SPI plasma prep cleaner
- "Smart-1" STM-20 electromechanical testing system
- Applied Test Systems, Inc. 2410 lever arm creep testing system
- South Bay Technology Model 850 wire saw
- Electron Microscopy Sciences 150T turbo-pumped combo sputter and carbon coater
- Leica ultramicrotome EM UC7 with control unit
- Olympus PMG3 inverted metallurgic microscope with attached digital camera
Technical info & pricing: EMMF website | Krista Carlson, Director (775) 682-6245 | Karthik Baskaran, Manager
For entities external to NSHE, contact the ÁùºÏ±¦µä Center for Applied Research for access: ncar@unr.edu | (775) 784-4781